DAC3154EVM DAC3154 Dual-Channel, 10-Bit, 500-MSPS Digital-to-Analog Converter Evaluation Module angled board image

DAC3154EVM

DAC3154 Dual-Channel, 10-Bit, 500-MSPS Digital-to-Analog Converter Evaluation Module

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Features for the DAC3154EVM

  • Comprehensive test capability for the DAC3154 for IF and RF outputs
  • Direct connection to TSW1400 signal generator
  • Includes CDCE62005 for clock generation or jitter cleaning
  • Includes TRF3705 for complete transmitter evaluation
  • Software support with a full featured GUI for easy testing
  • Direct HSMC connection to Altera FPGA development kits
  • FMC-DAC-Adapter card to connect to a standard FMC interconnect header, a typical input on the latest Xilinx FPGA EVMs

Description for the DAC3154EVM

The DAC3154EVM is a circuit board that allows designers to evaluate the performance of Texas Instruments' dual-channel 10-bit 500 MSPS DAC3154 digital-to-analog converter (DAC). The EVM provides a flexible environment to test the DAC3154 under a variety of clock, and input conditions. For ease of use as a complete RF transmit solution the DAC3154EVM includes the CDCE62005 clock generator/jitter cleaner for clocking the DAC3154 as well as a TRF3705, a 400MHz to 4GHz quadrature modulator, for upconverting I/Q outputs from the DAC to real signals at RF.

The EVM can be used along with TSW1400 to perform a wide range of test procedures. The TSW1400 generates the test patterns which are fed to the DAC3154 through a 1.00 GSPS LVDS port. The DAC3154EVM clock chip can be used to synchronize the TSW1400 board to DAC3154EVM. The TSW1406EVM provides a low-cost solution for quick EVM testing with up to 64k sample pattern depth.

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