See datasheet for actual packaging/pinout drawings

Packaging

Package | PIN:

AAV | 144

Temp:

I (-40 to 85)

ECO Plan:

TBD

PADC12DJ3200AAV


12-Bit, Dual 3.2-GSPS or Single 6.4-GSPS, RF-Sampling Analog-to-Digital Converter (ADC)

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Texas Instruments PADC12DJ3200AAV

ADC12DJ3200 is an RF-sampling giga-sample ADC that can directly sample input frequencies from DC to above 10 GHz. In dual channel mode, ADC12DJ3200 can sample up to 3200-MSPS and in single channel mode up to 6400-MSPS. Programmable tradeoffs in channel count (dual channel mode) and Nyquist bandwidth (single channel mode) allow development of flexible hardware that meets the needs of both high channel count or wide instantaneous signal bandwidth applications. Full power input bandwidth (-3 dB) of 8.0 GHz, with usable frequencies exceeding the -3 dB point in both dual and single channel modes, allows direct RF sampling of L-band, S-band, C-band and X-band for frequency agile systems.

ADC12DJ3200 uses a high speed JESD204B output interface with up to 16 serialized lanes and subclass-1 compliance for deterministic latency and multi-device synchronization. The serial output lanes support up to 12.8 Gbps and can be configured to trade-off bit rate and number of lanes. Innovative synchronization features, including noiseless aperture delay (TAD) adjustment and SYSREF windowing, simplify system design for phased array radar and MIMO communications. Optional digital down converters (DDCs) in dual channel mode allow for reduction in interface rate (real and complex decimation modes) and digital mixing of the signal (complex decimation modes only).

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