Features for the TPD3S716-Q1EVM
- IEC61000-4-2 compliance testing
- 4-port s-parameter analysis
- USB 2.0 throughput analysis
- Electrostatic discharge (ESD) clamping waveforms during an ESD event
Description for the TPD3S716-Q1EVM
The TPD3S716-Q1EVM contains four TPD3S716-Q1 devices. One TPD3S716-Q1 (U1) is configured with two USB 2.0 Type-A connectors (USB1 and USB2) for capturing system-level tests. One TPD3S716-Q1 (U2) is configured with four SMA (S1–S4) connectors to allow 4-port analysis with a vector network analyzer. One TPD3S716-Q1 (U3) is configured with test points for striking ESD to the protection pins. U3 is also configured for capturing clamping waveforms using J3 with an oscilloscope during an ESD test. One TPD3S716-Q1 (U4) is pinned out for device-level tests.